Analysis of Defect to Yield Correlation on Memories: Method, Algorithms and Limits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dft/BicheboisM97
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/dft/BicheboisM97
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Pascal_Bichebois
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Pierre_Mathery
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.1997.628308
>
foaf:
homepage
<
https://doi.org/10.1109/DFTVS.1997.628308
>
dc:
identifier
DBLP conf/dft/BicheboisM97
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDFTVS.1997.628308
(xsd:string)
dcterms:
issued
1997
(xsd:gYear)
rdfs:
label
Analysis of Defect to Yield Correlation on Memories: Method, Algorithms and Limits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Pascal_Bichebois
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Pierre_Mathery
>
swrc:
pages
44-52
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/dft/1997
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/dft/BicheboisM97/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/dft/BicheboisM97
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/dft/dft1997.html#BicheboisM97
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DFTVS.1997.628308
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/dft
>
dc:
subject
defect, failure, yield, correlation, method, errors, limits, algorithm, inspection, tool
(xsd:string)
dc:
title
Analysis of Defect to Yield Correlation on Memories: Method, Algorithms and Limits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document