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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/BolchiniBSS96>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cristiana_Bolchini>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giacomo_Buonanno>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Renato_Stefanelli>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.1996.572032>
foaf:homepage <https://doi.org/10.1109/DFTVS.1996.572032>
dc:identifier DBLP conf/dft/BolchiniBSS96 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.1996.572032 (xsd:string)
dcterms:issued 1996 (xsd:gYear)
rdfs:label Fault detection and fault tolerance issues at CMOS level through AUED encoding. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cristiana_Bolchini>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Donatella_Sciuto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giacomo_Buonanno>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Renato_Stefanelli>
swrc:pages 258-267 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/1996>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/BolchiniBSS96/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/BolchiniBSS96>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft1996.html#BolchiniBSS96>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.1996.572032>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Fault detection and fault tolerance issues at CMOS level through AUED encoding. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document