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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Luc_Salvo>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phanie_Anceau>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFT59622.2023.10313553>
foaf:homepage <https://doi.org/10.1109/DFT59622.2023.10313553>
dc:identifier DBLP conf/dft/BouatAMCST23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFT59622.2023.10313553 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Laurent_Maingault>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Luc_Salvo>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S._Bouat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/St%E2%88%9A%C2%A9phanie_Anceau>
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swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document