Design Scan Test Strategy for Single Phase Dynamic Circuits. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ching-Hwa_Cheng>
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dc:identifier	DBLP conf/dft/Cheng03 (xsd:string)
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dc:title	Design Scan Test Strategy for Single Phase Dynamic Circuits. (xsd:string)
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