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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/EbrahimiRK16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alireza_Rohani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hassan_Ebrahimi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFT.2016.7684075>
foaf:homepage <https://doi.org/10.1109/DFT.2016.7684075>
dc:identifier DBLP conf/dft/EbrahimiRK16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFT.2016.7684075 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Detecting intermittent resistive faults in digital CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alireza_Rohani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hassan_Ebrahimi>
swrc:pages 87-90 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/EbrahimiRK16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/EbrahimiRK16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2016.html#EbrahimiRK16>
rdfs:seeAlso <https://doi.org/10.1109/DFT.2016.7684075>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Detecting intermittent resistive faults in digital CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document