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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/GranhaugA06>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kristian_Granhaug>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Snorre_Aunet>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFT.2006.35>
foaf:homepage <https://doi.org/10.1109/DFT.2006.35>
dc:identifier DBLP conf/dft/GranhaugA06 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFT.2006.35 (xsd:string)
dcterms:issued 2006 (xsd:gYear)
rdfs:label Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kristian_Granhaug>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Snorre_Aunet>
swrc:pages 20-28 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2006>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/GranhaugA06/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/GranhaugA06>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2006.html#GranhaugA06>
rdfs:seeAlso <https://doi.org/10.1109/DFT.2006.35>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document