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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/GuoL98>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu-Yau_Guo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.1998.732166>
foaf:homepage <https://doi.org/10.1109/DFTVS.1998.732166>
dc:identifier DBLP conf/dft/GuoL98 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.1998.732166 (xsd:string)
dcterms:issued 1998 (xsd:gYear)
rdfs:label Challenges of Built-In Current Sensor Designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu-Yau_Guo>
swrc:pages 192- (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/1998>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/GuoL98/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/GuoL98>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft1998.html#GuoL98>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.1998.732166>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:subject Current testing, built-in current sensor, voltage regulator, decoupling capacitor. (xsd:string)
dc:title Challenges of Built-In Current Sensor Designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document