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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/Li23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFT59622.2023.10313537>
foaf:homepage <https://doi.org/10.1109/DFT59622.2023.10313537>
dc:identifier DBLP conf/dft/Li23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFT59622.2023.10313537 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jin-Fu_Li_0001>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/Li23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/Li23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2023.html#Li23>
rdfs:seeAlso <https://doi.org/10.1109/DFT59622.2023.10313537>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document