AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dft/LiHHTHLMHBWTW10
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/dft/LiHHTHLMHBWTW10
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chao-Wen_Tzeng
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ching-Cheng_Tien
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hsi-Pin_Ma
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hsuan-Jung_Hsu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jenn-Chyou_Bor
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jing-Jia_Liou
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mike_Wang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Po-Chiun_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tsung-Yeh_Li
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDFT.2010.48
>
foaf:
homepage
<
https://doi.org/10.1109/DFT.2010.48
>
dc:
identifier
DBLP conf/dft/LiHHTHLMHBWTW10
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDFT.2010.48
(xsd:string)
dcterms:
issued
2010
(xsd:gYear)
rdfs:
label
AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chao-Wen_Tzeng
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ching-Cheng_Tien
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hsi-Pin_Ma
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hsuan-Jung_Hsu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jenn-Chyou_Bor
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jing-Jia_Liou
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mike_Wang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Po-Chiun_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tsung-Yeh_Li
>
swrc:
pages
340-348
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/dft/2010
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/dft/LiHHTHLMHBWTW10/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/dft/LiHHTHLMHBWTW10
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/dft/dft2010.html#LiHHTHLMHBWTW10
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DFT.2010.48
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/dft
>
dc:
title
AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document