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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/LiHHTHLMHBWTW10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chao-Wen_Tzeng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ching-Cheng_Tien>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsi-Pin_Ma>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsuan-Jung_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jenn-Chyou_Bor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing-Jia_Liou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mike_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Po-Chiun_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Yeh_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFT.2010.48>
foaf:homepage <https://doi.org/10.1109/DFT.2010.48>
dc:identifier DBLP conf/dft/LiHHTHLMHBWTW10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFT.2010.48 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chao-Wen_Tzeng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ching-Cheng_Tien>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsi-Pin_Ma>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsuan-Jung_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jenn-Chyou_Bor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing-Jia_Liou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mike_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Po-Chiun_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Yeh_Li>
swrc:pages 340-348 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2010>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/LiHHTHLMHBWTW10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/LiHHTHLMHBWTW10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2010.html#LiHHTHLMHBWTW10>
rdfs:seeAlso <https://doi.org/10.1109/DFT.2010.48>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title AF-Test: Adaptive-Frequency Scan Test Methodology for Small-Delay Defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document