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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/LoF93>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eiji_Fujiwara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
dc:identifier DBLP conf/dft/LoF93 (xsd:string)
dcterms:issued 1993 (xsd:gYear)
rdfs:label A Probabilistic Measurement for Totally Self-Checking Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eiji_Fujiwara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jien-Chung_Lo>
swrc:pages 263-270 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/1993>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/LoF93/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/LoF93>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft1993.html#LoF93>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title A Probabilistic Measurement for Totally Self-Checking Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document