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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/LuSQT03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bing_Qiu_0003>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jacques_Taillefer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meng_Lu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.2003.1250091>
foaf:homepage <https://doi.org/10.1109/DFTVS.2003.1250091>
dc:identifier DBLP conf/dft/LuSQT03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.2003.1250091 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bing_Qiu_0003>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jacques_Taillefer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meng_Lu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
swrc:pages 18-25 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/LuSQT03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/LuSQT03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2003.html#LuSQT03>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.2003.1250091>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title IEEE 1149.1 Based Defect and Fault Tolerant Scan Chain for Wafer Scale Integration. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document