An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dft/NarangVKH21
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/dft/NarangVKH21
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Anuraag_Narang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Balaji_Venn
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Peter_Harrod
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/S._Saqib_Khursheed
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDFT52944.2021.9568326
>
foaf:
homepage
<
https://doi.org/10.1109/DFT52944.2021.9568326
>
dc:
identifier
DBLP conf/dft/NarangVKH21
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDFT52944.2021.9568326
(xsd:string)
dcterms:
issued
2021
(xsd:gYear)
rdfs:
label
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Anuraag_Narang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Balaji_Venn
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Peter_Harrod
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/S._Saqib_Khursheed
>
swrc:
pages
1-6
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/dft/2021
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/dft/NarangVKH21/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/dft/NarangVKH21
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/dft/dft2021.html#NarangVKH21
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DFT52944.2021.9568326
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/dft
>
dc:
title
An Exploration of Microprocessor Self-Test Optimisation Based On Safe Faults.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document