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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/OlowogemoQLRL22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bor-Tyng_Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_B._Limbrick>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Qiu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Semiu_A._Olowogemo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/William_H._Robinson>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFT56152.2022.9962348>
foaf:homepage <https://doi.org/10.1109/DFT56152.2022.9962348>
dc:identifier DBLP conf/dft/OlowogemoQLRL22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFT56152.2022.9962348 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bor-Tyng_Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_B._Limbrick>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Qiu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Semiu_A._Olowogemo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/William_H._Robinson>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2022>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/OlowogemoQLRL22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2022.html#OlowogemoQLRL22>
rdfs:seeAlso <https://doi.org/10.1109/DFT56152.2022.9962348>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Model-Based Analysis of Single-Event Upset (SEU) Vulnerability of 6T SRAM Using FinFET Technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document