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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/ParimiS04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nitin_Parimi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoling_Sun>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FDFT.2004.61>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/DFT.2004.61>
dc:identifier DBLP conf/dft/ParimiS04 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FDFT.2004.61 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Toggle-Masking for Test-per-Scan VLSI Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nitin_Parimi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoling_Sun>
swrc:pages 332-338 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/ParimiS04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/ParimiS04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2004.html#ParimiS04>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/DFT.2004.61>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Toggle-Masking for Test-per-Scan VLSI Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document