Regressive Testing for System-on-Chip with Unknown-Good-Yield.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dft/ParkJGPC03
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/dft/ParkJGPC03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Byoungjae_Jin
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/K._M._George
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Minsu_Choi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Noh-Jin_Park
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nohpill_Park
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.2003.1250136
>
foaf:
homepage
<
https://doi.org/10.1109/DFTVS.2003.1250136
>
dc:
identifier
DBLP conf/dft/ParkJGPC03
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDFTVS.2003.1250136
(xsd:string)
dcterms:
issued
2003
(xsd:gYear)
rdfs:
label
Regressive Testing for System-on-Chip with Unknown-Good-Yield.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Byoungjae_Jin
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/K._M._George
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Minsu_Choi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Noh-Jin_Park
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nohpill_Park
>
swrc:
pages
393-400
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/dft/2003
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/dft/ParkJGPC03/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/dft/ParkJGPC03
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/dft/dft2003.html#ParkJGPC03
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DFTVS.2003.1250136
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/dft
>
dc:
title
Regressive Testing for System-on-Chip with Unknown-Good-Yield.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document