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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/Riley99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stuart_L._Riley>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.1999.802868>
foaf:homepage <https://doi.org/10.1109/DFTVS.1999.802868>
dc:identifier DBLP conf/dft/Riley99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.1999.802868 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label Limitations to Estimating Yield Based on In-Line Defect Measurements. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stuart_L._Riley>
swrc:pages 46-54 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/Riley99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/Riley99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft1999.html#Riley99>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.1999.802868>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:subject Defect-limited yield, Yield estimation, Yield prediction, In-line defect measurements, Defect classification, Kill ratio estimation, Defect review sampling (xsd:string)
dc:title Limitations to Estimating Yield Based on In-Line Defect Measurements. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document