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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/SpinksCBZ97>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chris_D._Chalk>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ian_M._Bell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mark_Zwolinski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Stephen_J._Spinks>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.1997.628315>
foaf:homepage <https://doi.org/10.1109/DFTVS.1997.628315>
dc:identifier DBLP conf/dft/SpinksCBZ97 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.1997.628315 (xsd:string)
dcterms:issued 1997 (xsd:gYear)
rdfs:label Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chris_D._Chalk>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ian_M._Bell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mark_Zwolinski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Stephen_J._Spinks>
swrc:pages 100-109 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/1997>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/SpinksCBZ97/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/SpinksCBZ97>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft1997.html#SpinksCBZ97>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.1997.628315>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:subject Analogue fault simulation, Test pattern generation, Supply current monitoring Test quality evaluation, Analogue circuit testing (xsd:string)
dc:title Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document