Effect of Process Variation on the Performance of Phase Frequency Detector.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/dft/VenugopalSU06
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/dft/VenugopalSU06
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nandakumar_P._Venugopal
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Nihal_Shastry
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shambhu_J._Upadhyaya
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDFT.2006.23
>
foaf:
homepage
<
https://doi.org/10.1109/DFT.2006.23
>
dc:
identifier
DBLP conf/dft/VenugopalSU06
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDFT.2006.23
(xsd:string)
dcterms:
issued
2006
(xsd:gYear)
rdfs:
label
Effect of Process Variation on the Performance of Phase Frequency Detector.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nandakumar_P._Venugopal
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Nihal_Shastry
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shambhu_J._Upadhyaya
>
swrc:
pages
525-534
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/dft/2006
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/dft/VenugopalSU06/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/dft/VenugopalSU06
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/dft/dft2006.html#VenugopalSU06
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DFT.2006.23
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/dft
>
dc:
subject
Jitter, Monte Carlo simulation, Phase Frequency Detector (PFD), Phase noise, process variation, NFET, PFET
(xsd:string)
dc:
title
Effect of Process Variation on the Performance of Phase Frequency Detector.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document