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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/WangHH02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Horng-Bin_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jing-Reng_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.2002.1173508>
foaf:homepage <https://doi.org/10.1109/DFTVS.2002.1173508>
dc:identifier DBLP conf/dft/WangHH02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.2002.1173508 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Horng-Bin_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jing-Reng_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shi-Yu_Huang>
swrc:pages 117-128 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/WangHH02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/WangHH02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2002.html#WangHH02>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.2002.1173508>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:title Gate-Delay Fault Diagnosis Using the Inject-and-Evaluate Paradigm. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document