[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/WangWI04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Baosheng_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuejian_Wu>
foaf:homepage <http://dx.doi.org/doi.ieeecomputersociety.org%2F10.1109%2FDFT.2004.25>
foaf:homepage <https://doi.ieeecomputersociety.org/10.1109/DFT.2004.25>
dc:identifier DBLP conf/dft/WangWI04 (xsd:string)
dc:identifier DOI doi.ieeecomputersociety.org%2F10.1109%2FDFT.2004.25 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label Designs for Reducing Test Time of Distributed Small Embedded SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Baosheng_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuejian_Wu>
swrc:pages 120-128 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/WangWI04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/WangWI04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2004.html#WangWI04>
rdfs:seeAlso <https://doi.ieeecomputersociety.org/10.1109/DFT.2004.25>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:subject Distributed Small Embedded SRAMs, Data Retention Fault Test, Response Analysis, Test Time (xsd:string)
dc:title Designs for Reducing Test Time of Distributed Small Embedded SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document