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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dft/XuanC01>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiangdong_Xuan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDFTVS.2001.966785>
foaf:homepage <https://doi.org/10.1109/DFTVS.2001.966785>
dc:identifier DBLP conf/dft/XuanC01 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDFTVS.2001.966785 (xsd:string)
dcterms:issued 2001 (xsd:gYear)
rdfs:label Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiangdong_Xuan>
swrc:pages 323-328 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dft/2001>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dft/XuanC01/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dft/XuanC01>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dft/dft2001.html#XuanC01>
rdfs:seeAlso <https://doi.org/10.1109/DFTVS.2001.966785>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dft>
dc:subject Electromigration, hot-carrier, performance degradation, hierarchical analysis, hot-spot (xsd:string)
dc:title Sensitivity and Reliability Evaluation for Mixed-Signal ICs under Electromigration and Hot-Carrier Effects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document