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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/drc/HoangDWKKQISWP22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alwin_Daus>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Eric_Pop>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/H.-S._Philip_Wong>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jimin_Kwon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jung-Soo_Ko>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krishna_C._Saraswat>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lauren_Hoang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahnaz_Islam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shengjun_Qin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sumaiya_Wahid>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDRC55272.2022.9855789>
foaf:homepage <https://doi.org/10.1109/DRC55272.2022.9855789>
dc:identifier DBLP conf/drc/HoangDWKKQISWP22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDRC55272.2022.9855789 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alwin_Daus>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Eric_Pop>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/H.-S._Philip_Wong>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jimin_Kwon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jung-Soo_Ko>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krishna_C._Saraswat>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lauren_Hoang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahnaz_Islam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shengjun_Qin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sumaiya_Wahid>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/drc/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/drc/HoangDWKKQISWP22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/drc/HoangDWKKQISWP22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/drc/drc2022.html#HoangDWKKQISWP22>
rdfs:seeAlso <https://doi.org/10.1109/DRC55272.2022.9855789>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/drc>
dc:title Bias Stress Stability of ITO Transistors and its Dependence on Dielectric Properties. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document