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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/drc/SurendranathanWR23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Biswajit_Ray>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Horace_Wilson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Umeshwarnath_Surendranathan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDRC58590.2023.10187098>
foaf:homepage <https://doi.org/10.1109/DRC58590.2023.10187098>
dc:identifier DBLP conf/drc/SurendranathanWR23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDRC58590.2023.10187098 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Technology scaling effects on SRAM-PUF reliability under ionizing radiation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Biswajit_Ray>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Horace_Wilson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Umeshwarnath_Surendranathan>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/drc/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/drc/SurendranathanWR23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/drc/SurendranathanWR23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/drc/drc2023.html#SurendranathanWR23>
rdfs:seeAlso <https://doi.org/10.1109/DRC58590.2023.10187098>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/drc>
dc:title Technology scaling effects on SRAM-PUF reliability under ionizing radiation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document