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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/drc/ZhangBRCELWGI18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adrian_Mihai_Ionescu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Erick_Garcia_Cordero>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabien_Wildhaber>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francesco_Bellando>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hoel_Guerin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._Longo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Junrui_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Maneesha_Rupakula>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/N._Ebejer>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDRC.2018.8442197>
foaf:homepage <https://doi.org/10.1109/DRC.2018.8442197>
dc:identifier DBLP conf/drc/ZhangBRCELWGI18 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDRC.2018.8442197 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adrian_Mihai_Ionescu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Erick_Garcia_Cordero>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabien_Wildhaber>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francesco_Bellando>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hoel_Guerin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._Longo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Junrui_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Maneesha_Rupakula>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/N._Ebejer>
swrc:pages 1-2 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/drc/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/drc/ZhangBRCELWGI18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/drc/ZhangBRCELWGI18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/drc/drc2018.html#ZhangBRCELWGI18>
rdfs:seeAlso <https://doi.org/10.1109/DRC.2018.8442197>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/drc>
dc:title CMOS 3D-Extended Metal Gate ISFETs with Near Nernstian Ion Sensitivity. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document