Exploiting Bus Level and Bit Level Inactivity for Preventing Wire Degradation due to Electromigration.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/dsd/KayaalpKE12a
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fahrettin_Koc
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mehmet_Kayaalp_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Oguz_Ergin
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FDSD.2012.56
>
foaf:
homepage
<
https://doi.org/10.1109/DSD.2012.56
>
dc:
identifier
DBLP conf/dsd/KayaalpKE12a
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FDSD.2012.56
(xsd:string)
dcterms:
issued
2012
(xsd:gYear)
rdfs:
label
Exploiting Bus Level and Bit Level Inactivity for Preventing Wire Degradation due to Electromigration.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fahrettin_Koc
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mehmet_Kayaalp_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Oguz_Ergin
>
swrc:
pages
280-287
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/dsd/2012
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/dsd/KayaalpKE12a/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/dsd/KayaalpKE12a
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/dsd/dsd2012.html#KayaalpKE12a
>
rdfs:
seeAlso
<
https://doi.org/10.1109/DSD.2012.56
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/dsd
>
dc:
title
Exploiting Bus Level and Bit Level Inactivity for Preventing Wire Degradation due to Electromigration.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document