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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dsd/KuknerWRKCPLG12>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Halil_Kukner>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liesbet_Van_der_Perre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Praveen_Raghavan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rudy_Lauwereins>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDSD.2012.77>
foaf:homepage <https://doi.org/10.1109/DSD.2012.77>
dc:identifier DBLP conf/dsd/KuknerWRKCPLG12 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDSD.2012.77 (xsd:string)
dcterms:issued 2012 (xsd:gYear)
rdfs:label Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ben_Kaczer>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Francky_Catthoor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guido_Groeseneken>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Halil_Kukner>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liesbet_Van_der_Perre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pieter_Weckx>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Praveen_Raghavan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rudy_Lauwereins>
swrc:pages 1-7 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dsd/2012>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dsd/KuknerWRKCPLG12/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dsd/KuknerWRKCPLG12>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dsd/dsd2012.html#KuknerWRKCPLG12>
rdfs:seeAlso <https://doi.org/10.1109/DSD.2012.77>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dsd>
dc:title Impact of Duty Factor, Stress Stimuli, and Gate Drive Strength on Gate Delay Degradation with an Atomistic Trap-Based BTI Model. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document