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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dsd/RajiGP15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Behnam_Ghavami>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hossein_Pedram>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohsen_Raji>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDSD.2015.103>
foaf:homepage <https://doi.org/10.1109/DSD.2015.103>
dc:identifier DBLP conf/dsd/RajiGP15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDSD.2015.103 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Gate Resizing for Soft Error Rate Reduction in Nano-scale Digital Circuits Considering Process Variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Behnam_Ghavami>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hossein_Pedram>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohsen_Raji>
swrc:pages 445-452 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dsd/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dsd/RajiGP15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dsd/RajiGP15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dsd/dsd2015.html#RajiGP15>
rdfs:seeAlso <https://doi.org/10.1109/DSD.2015.103>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dsd>
dc:title Gate Resizing for Soft Error Rate Reduction in Nano-scale Digital Circuits Considering Process Variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document