[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dsd/SudbrockRUKP05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joachim_Sudbrock>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wieslaw_Kuzmicz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Witold_A._Pleskacz>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDSD.2005.30>
foaf:homepage <https://doi.org/10.1109/DSD.2005.30>
dc:identifier DBLP conf/dsd/SudbrockRUKP05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDSD.2005.30 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaan_Raik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joachim_Sudbrock>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Raimund_Ubar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wieslaw_Kuzmicz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Witold_A._Pleskacz>
swrc:pages 79-82 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dsd/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dsd/SudbrockRUKP05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dsd/SudbrockRUKP05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dsd/dsd2005.html#SudbrockRUKP05>
rdfs:seeAlso <https://doi.org/10.1109/DSD.2005.30>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dsd>
dc:title Defect-Oriented Test- and Layout-Generation for Standard-Cell ASIC Designs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document