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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/dsit/WangW22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rui_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Songhao_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FDSIT55514.2022.9943882>
foaf:homepage <https://doi.org/10.1109/DSIT55514.2022.9943882>
dc:identifier DBLP conf/dsit/WangW22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FDSIT55514.2022.9943882 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Tensor Voting Based Similarity Matching of Wafer Bin Maps in Semiconductor Manufacturing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rui_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Songhao_Wang>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/dsit/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/dsit/WangW22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/dsit/WangW22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/dsit/dsit2022.html#WangW22>
rdfs:seeAlso <https://doi.org/10.1109/DSIT55514.2022.9943882>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/dsit>
dc:title Tensor Voting Based Similarity Matching of Wafer Bin Maps in Semiconductor Manufacturing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document