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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ecoc/TaoFYSNH21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hisao_Nakashima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Hoshida>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tong_Ye>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaofei_Su>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yangyang_Fan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhenning_Tao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FECOC52684.2021.9605882>
foaf:homepage <https://doi.org/10.1109/ECOC52684.2021.9605882>
dc:identifier DBLP conf/ecoc/TaoFYSNH21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FECOC52684.2021.9605882 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Characterization, Modelling and Measurement of Device Imperfections in Advanced Coherent Transceivers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hisao_Nakashima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Hoshida>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tong_Ye>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaofei_Su>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yangyang_Fan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhenning_Tao>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ecoc/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ecoc/TaoFYSNH21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ecoc/TaoFYSNH21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ecoc/ecoc2021.html#TaoFYSNH21>
rdfs:seeAlso <https://doi.org/10.1109/ECOC52684.2021.9605882>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ecoc>
dc:title Characterization, Modelling and Measurement of Device Imperfections in Advanced Coherent Transceivers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document