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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/edcc/NovakZP05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jir%E2%88%9A%E2%89%A0_Zahr%E2%88%9A%C2%B0dka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ondrej_Nov%E2%88%9A%C2%B0k>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zdenek_Pl%E2%88%9A%E2%89%A0va>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F11408901%5F30>
foaf:homepage <https://doi.org/10.1007/11408901_30>
dc:identifier DBLP conf/edcc/NovakZP05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F11408901%5F30 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jir%E2%88%9A%E2%89%A0_Zahr%E2%88%9A%C2%B0dka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ondrej_Nov%E2%88%9A%C2%B0k>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zdenek_Pl%E2%88%9A%E2%89%A0va>
swrc:pages 403-414 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/edcc/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/edcc/NovakZP05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/edcc/NovakZP05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/edcc/edcc2005.html#NovakZP05>
rdfs:seeAlso <https://doi.org/10.1007/11408901_30>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/edcc>
dc:title COMPAS - Compressed Test Pattern Sequencer for Scan Based Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document