Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/eeet/ShenGSH20
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/eeet/ShenGSH20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Quan_Sun
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xiaoyan_Guo
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yong_Huang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yue_Shen
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1145%2F3429536.3429547
>
foaf:
homepage
<
https://doi.org/10.1145/3429536.3429547
>
dc:
identifier
DBLP conf/eeet/ShenGSH20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1145%2F3429536.3429547
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
rdfs:
label
Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Quan_Sun
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xiaoyan_Guo
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yong_Huang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yue_Shen
>
swrc:
pages
23-27
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/eeet/2020
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/eeet/ShenGSH20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/eeet/ShenGSH20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/eeet/eeet2020.html#ShenGSH20
>
rdfs:
seeAlso
<
https://doi.org/10.1145/3429536.3429547
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/eeet
>
dc:
title
Research on EMC Tests of Intelligent Monitoring Devices for Metal-Oxide Surge Arresters.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document