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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ei-ipmva/NagatoFK13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Fuse>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Koezuka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsuyoshi_Nagato>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1117%2F12.2001768>
foaf:homepage <https://doi.org/10.1117/12.2001768>
dc:identifier DBLP conf/ei-ipmva/NagatoFK13 (xsd:string)
dc:identifier DOI doi.org%2F10.1117%2F12.2001768 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label Defect inspection technology for a gloss-coated surface using patterned illumination. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Fuse>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Koezuka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsuyoshi_Nagato>
swrc:pages 866110 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ei-ipmva/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ei-ipmva/NagatoFK13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ei-ipmva/NagatoFK13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ei-ipmva/ei-ipmva2013.html#NagatoFK13>
rdfs:seeAlso <https://doi.org/10.1117/12.2001768>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ei-ipmva>
dc:title Defect inspection technology for a gloss-coated surface using patterned illumination. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document