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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/eit/WuCLR08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jiann-Chyi_Rau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Po-Han_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Tang_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-Lin_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEIT.2008.4554304>
foaf:homepage <https://doi.org/10.1109/EIT.2008.4554304>
dc:identifier DBLP conf/eit/WuCLR08 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEIT.2008.4554304 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label An efficient test-data compaction for low power VLSI testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jiann-Chyi_Rau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Po-Han_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Tang_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-Lin_Li>
swrc:pages 237-241 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/eit/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/eit/WuCLR08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/eit/WuCLR08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/eit/eit2008.html#WuCLR08>
rdfs:seeAlso <https://doi.org/10.1109/EIT.2008.4554304>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/eit>
dc:title An efficient test-data compaction for low power VLSI testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document