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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/eitce/HouSLCX23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cong_Hou>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lin_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaotian_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yue_Sun>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3650400.3650676>
foaf:homepage <https://doi.org/10.1145/3650400.3650676>
dc:identifier DBLP conf/eitce/HouSLCX23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3650400.3650676 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Code Defect Detection Model with Multi-layer Bi-directional Long Short Term Memory based on Self-Attention Mechanism. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cong_Hou>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lin_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaotian_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yue_Sun>
swrc:pages 1656-1660 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/eitce/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/eitce/HouSLCX23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/eitce/HouSLCX23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/eitce/eitce2023.html#HouSLCX23>
rdfs:seeAlso <https://doi.org/10.1145/3650400.3650676>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/eitce>
dc:title Code Defect Detection Model with Multi-layer Bi-directional Long Short Term Memory based on Self-Attention Mechanism. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document