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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/eitce/YuZWCLWH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bo_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hongyu_He>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hongzhen_Chu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huicheng_Zhao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ning_Wei>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xinlin_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuehua_Li>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3650400.3650404>
foaf:homepage <https://doi.org/10.1145/3650400.3650404>
dc:identifier DBLP conf/eitce/YuZWCLWH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3650400.3650404 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label An a-IGZO TFT Pixel Circuit to Compensate Electrical Characteristics Variation and OLED Degradation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bo_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hongyu_He>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hongzhen_Chu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huicheng_Zhao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ning_Wei>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xinlin_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuehua_Li>
swrc:pages 18-23 (xsd:string)
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/eitce/YuZWCLWH23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/eitce/eitce2023.html#YuZWCLWH23>
rdfs:seeAlso <https://doi.org/10.1145/3650400.3650404>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/eitce>
dc:title An a-IGZO TFT Pixel Circuit to Compensate Electrical Characteristics Variation and OLED Degradation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document