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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/ejc/StrbaB20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniela_Bordencea>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Radoslav_Strba>
foaf:homepage <http://dx.doi.org/doi.org%2F10.3233%2FFAIA200828>
foaf:homepage <https://doi.org/10.3233/FAIA200828>
dc:identifier DBLP conf/ejc/StrbaB20 (xsd:string)
dc:identifier DOI doi.org%2F10.3233%2FFAIA200828 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural Network. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniela_Bordencea>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Radoslav_Strba>
swrc:pages 174-186 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/ejc/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/ejc/StrbaB20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/ejc/StrbaB20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/ejc/ejc2020.html#StrbaB20>
rdfs:seeAlso <https://doi.org/10.3233/FAIA200828>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/ejc>
dc:title Defects Recognition on Wafer Maps Using Multilayer Feed-Forward Neural Network. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document