Empirical Analysis of Side-Channel Attack Resistance of HLS-designed AES Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/elinfocom/MizunoNKT23
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/elinfocom/MizunoNKT23
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hiroki_Nishikawa
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Tomiyama
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Takumi_Mizuno
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xiangbo_Kong
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FICEIC57457.2023.10049904
>
foaf:
homepage
<
https://doi.org/10.1109/ICEIC57457.2023.10049904
>
dc:
identifier
DBLP conf/elinfocom/MizunoNKT23
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FICEIC57457.2023.10049904
(xsd:string)
dcterms:
issued
2023
(xsd:gYear)
rdfs:
label
Empirical Analysis of Side-Channel Attack Resistance of HLS-designed AES Circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hiroki_Nishikawa
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Tomiyama
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Takumi_Mizuno
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xiangbo_Kong
>
swrc:
pages
1-4
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/elinfocom/2023
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/elinfocom/MizunoNKT23/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/elinfocom/MizunoNKT23
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/elinfocom/iceic2023.html#MizunoNKT23
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ICEIC57457.2023.10049904
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/elinfocom
>
dc:
title
Empirical Analysis of Side-Channel Attack Resistance of HLS-designed AES Circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document