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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/elinfocom/MizunoNKT23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Nishikawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Tomiyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takumi_Mizuno>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiangbo_Kong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FICEIC57457.2023.10049904>
foaf:homepage <https://doi.org/10.1109/ICEIC57457.2023.10049904>
dc:identifier DBLP conf/elinfocom/MizunoNKT23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FICEIC57457.2023.10049904 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Empirical Analysis of Side-Channel Attack Resistance of HLS-designed AES Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroki_Nishikawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Tomiyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takumi_Mizuno>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiangbo_Kong>
swrc:pages 1-4 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/elinfocom/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/elinfocom/MizunoNKT23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/elinfocom/MizunoNKT23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/elinfocom/iceic2023.html#MizunoNKT23>
rdfs:seeAlso <https://doi.org/10.1109/ICEIC57457.2023.10049904>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/elinfocom>
dc:title Empirical Analysis of Side-Channel Attack Resistance of HLS-designed AES Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document