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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/emccompo/AldabbaghD15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmed_Aldabbagh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alistair_Duffy>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FEMCCompo.2015.7358349>
foaf:homepage <https://doi.org/10.1109/EMCCompo.2015.7358349>
dc:identifier DBLP conf/emccompo/AldabbaghD15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FEMCCompo.2015.7358349 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmed_Aldabbagh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alistair_Duffy>
swrc:pages 157-162 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/emccompo/2015>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/emccompo/AldabbaghD15/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/emccompo/AldabbaghD15>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/emccompo/emccompo2015.html#AldabbaghD15>
rdfs:seeAlso <https://doi.org/10.1109/EMCCompo.2015.7358349>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/emccompo>
dc:title Ageing effects on power RF LDMOS reliability using the Transmission Line Matrix method. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document