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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esem/KameiMMKM07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Akito_Monden>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken-ichi_Matsumoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinsuke_Matsumoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Kakimoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasutaka_Kamei>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESEM.2007.28>
foaf:homepage <https://doi.org/10.1109/ESEM.2007.28>
dc:identifier DBLP conf/esem/KameiMMKM07 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESEM.2007.28 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label The Effects of Over and Under Sampling on Fault-prone Module Detection. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Akito_Monden>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken-ichi_Matsumoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinsuke_Matsumoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Kakimoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasutaka_Kamei>
swrc:pages 196-204 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/esem/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/esem/KameiMMKM07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/esem/KameiMMKM07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/esem/esem2007.html#KameiMMKM07>
rdfs:seeAlso <https://doi.org/10.1109/ESEM.2007.28>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esem>
dc:title The Effects of Over and Under Sampling on Fault-prone Module Detection. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document