Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/esscirc/KamelHSFB10
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/esscirc/KamelHSFB10
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C2%A9dric_Hocquet
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/David_Bol
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Denis_Flandre
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dina_Kamel
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois-Xavier_Standaert
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FESSCIRC.2010.5619757
>
foaf:
homepage
<
https://doi.org/10.1109/ESSCIRC.2010.5619757
>
dc:
identifier
DBLP conf/esscirc/KamelHSFB10
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FESSCIRC.2010.5619757
(xsd:string)
dcterms:
issued
2010
(xsd:gYear)
rdfs:
label
Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C2%A9dric_Hocquet
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/David_Bol
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Denis_Flandre
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dina_Kamel
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois-Xavier_Standaert
>
swrc:
pages
518-521
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/esscirc/2010
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/esscirc/KamelHSFB10/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/esscirc/KamelHSFB10
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/esscirc/esscirc2010.html#KamelHSFB10
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ESSCIRC.2010.5619757
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/esscirc
>
dc:
title
Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document