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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esscirc/KamelHSFB10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C2%A9dric_Hocquet>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Bol>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Denis_Flandre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dina_Kamel>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois-Xavier_Standaert>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSCIRC.2010.5619757>
foaf:homepage <https://doi.org/10.1109/ESSCIRC.2010.5619757>
dc:identifier DBLP conf/esscirc/KamelHSFB10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSCIRC.2010.5619757 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C%E2%88%9A%C2%A9dric_Hocquet>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Bol>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Denis_Flandre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dina_Kamel>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fran%E2%88%9A%C3%9Fois-Xavier_Standaert>
swrc:pages 518-521 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ESSCIRC.2010.5619757>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esscirc>
dc:title Glitch-induced within-die variations of dynamic energy in voltage-scaled nano-CMOS circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document