A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/esscirc/LhommeCBCBC10
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/esscirc/LhommeCBCBC10
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Bertrand_Borot
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Brice_Lhomme
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Olivier_Callen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Sylvain_Clerc
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Thierry_Burdeau
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yann_Carminati
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FESSCIRC.2010.5619718
>
foaf:
homepage
<
https://doi.org/10.1109/ESSCIRC.2010.5619718
>
dc:
identifier
DBLP conf/esscirc/LhommeCBCBC10
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FESSCIRC.2010.5619718
(xsd:string)
dcterms:
issued
2010
(xsd:gYear)
rdfs:
label
A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Bertrand_Borot
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Brice_Lhomme
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Olivier_Callen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Sylvain_Clerc
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Thierry_Burdeau
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yann_Carminati
>
swrc:
pages
362-365
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/esscirc/2010
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/esscirc/LhommeCBCBC10/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/esscirc/LhommeCBCBC10
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/esscirc/esscirc2010.html#LhommeCBCBC10
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ESSCIRC.2010.5619718
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/esscirc
>
dc:
title
A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document