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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esscirc/OUchiELNMITYSKS10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hanpei_Koike>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiromi_Yamauchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Junichi_Tsukada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Endo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kunihiro_Sakamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Meishoku_Masahara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shin-ichi_O%27Uchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tadashi_Nakagawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Matsukawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshihiro_Sekigawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongxun_Liu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuki_Ishikawa>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSCIRC.2010.5619746>
foaf:homepage <https://doi.org/10.1109/ESSCIRC.2010.5619746>
dc:identifier DBLP conf/esscirc/OUchiELNMITYSKS10 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSCIRC.2010.5619746 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
rdfs:label 0.5V FinFET SRAM with dynamic threshold control of pass gates for salvaging malfunctioned bits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hanpei_Koike>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiromi_Yamauchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Junichi_Tsukada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuhiko_Endo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kunihiro_Sakamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Meishoku_Masahara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shin-ichi_O%27Uchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tadashi_Nakagawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Matsukawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshihiro_Sekigawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongxun_Liu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuki_Ishikawa>
swrc:pages 474-477 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/esscirc/2010>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/esscirc/OUchiELNMITYSKS10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/esscirc/esscirc2010.html#OUchiELNMITYSKS10>
rdfs:seeAlso <https://doi.org/10.1109/ESSCIRC.2010.5619746>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esscirc>
dc:title 0.5V FinFET SRAM with dynamic threshold control of pass gates for salvaging malfunctioned bits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document