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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esscirc/TakeuchiSOSNT16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fumio_Tsuchiya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kan_Takeuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Shibutani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaki_Shimada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Okagaki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSCIRC.2016.7598293>
foaf:homepage <https://doi.org/10.1109/ESSCIRC.2016.7598293>
dc:identifier DBLP conf/esscirc/TakeuchiSOSNT16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSCIRC.2016.7598293 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fumio_Tsuchiya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kan_Takeuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Shibutani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaki_Shimada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Okagaki>
swrc:pages 265-268 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/esscirc/2016>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/esscirc/esscirc2016.html#TakeuchiSOSNT16>
rdfs:seeAlso <https://doi.org/10.1109/ESSCIRC.2016.7598293>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esscirc>
dc:title FEOL/BEOL wear-out estimator using stress-to-frequency conversion of voltage/temperature-sensitive ring oscillators for 28nm automotive MCUs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document