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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esscirc/TanakaTIT16>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken_Takeuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kota_Tsurumi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Tanaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoya_Ishii>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSCIRC.2016.7598244>
foaf:homepage <https://doi.org/10.1109/ESSCIRC.2016.7598244>
dc:identifier DBLP conf/esscirc/TanakaTIT16 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSCIRC.2016.7598244 (xsd:string)
dcterms:issued 2016 (xsd:gYear)
rdfs:label Heterogeneously integrated program voltage generator for 1.0V operation NAND flash with best mix & match of standard CMOS process and NAND flash process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken_Takeuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kota_Tsurumi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masahiro_Tanaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoya_Ishii>
swrc:pages 67-70 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/esscirc/2016>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/esscirc/TanakaTIT16/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/esscirc/TanakaTIT16>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/esscirc/esscirc2016.html#TanakaTIT16>
rdfs:seeAlso <https://doi.org/10.1109/ESSCIRC.2016.7598244>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esscirc>
dc:title Heterogeneously integrated program voltage generator for 1.0V operation NAND flash with best mix & match of standard CMOS process and NAND flash process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document