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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/esscirc/YuPK21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gyusung_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hanzhao_Yu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSCIRC53450.2021.9567760>
foaf:homepage <https://doi.org/10.1109/ESSCIRC53450.2021.9567760>
dc:identifier DBLP conf/esscirc/YuPK21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSCIRC53450.2021.9567760 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chris_H._Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gyusung_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hanzhao_Yu>
swrc:pages 411-414 (xsd:string)
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/esscirc/YuPK21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/esscirc/esscirc2021.html#YuPK21>
rdfs:seeAlso <https://doi.org/10.1109/ESSCIRC53450.2021.9567760>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/esscirc>
dc:title Extreme Temperature Characterization of Amplifier Response up to 300 Degrees Celsius Using Integrated Heaters and On-chip Samplers. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document