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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/BlascoSM15>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrique_Miranda_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jordi_Su%E2%88%9A%C4%AA%E2%88%9A%C2%A9>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juli_Blasco>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2015.7324709>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2015.7324709>
dc:identifier DBLP conf/essderc/BlascoSM15 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2015.7324709 (xsd:string)
dcterms:issued 2015 (xsd:gYear)
rdfs:label Modeling of the conduction characteristics of voltage-driven bipolar RRAMs including turning point effects. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juli_Blasco>
swrc:pages 44-47 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2015.7324709>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title Modeling of the conduction characteristics of voltage-driven bipolar RRAMs including turning point effects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document