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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/ChenRKOC13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jay_Ondrusek>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Min_Chen_0024>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Krishnan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vijay_Reddy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Cao_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2013.6818849>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2013.6818849>
dc:identifier DBLP conf/essderc/ChenRKOC13 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2013.6818849 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
rdfs:label ACE: A robust variability and aging sensor for high-k/metal gate SoC. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jay_Ondrusek>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Min_Chen_0024>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Srikanth_Krishnan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vijay_Reddy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Cao_0001>
swrc:pages 182-185 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/essderc/2013>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/essderc/ChenRKOC13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/essderc/ChenRKOC13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/essderc/essderc2013.html#ChenRKOC13>
rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2013.6818849>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title ACE: A robust variability and aging sensor for high-k/metal gate SoC. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document