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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/essderc/FerraraSBHSSH14>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Ferrara>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anco_Heringa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andries_J._Scholten>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Boni_K._Boksteen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jurriaan_Schmitz>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_G._Steeneken>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Raymond_J._E._Hueting>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FESSDERC.2014.6948825>
foaf:homepage <https://doi.org/10.1109/ESSDERC.2014.6948825>
dc:identifier DBLP conf/essderc/FerraraSBHSSH14 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FESSDERC.2014.6948825 (xsd:string)
dcterms:issued 2014 (xsd:gYear)
rdfs:label Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alessandro_Ferrara>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anco_Heringa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andries_J._Scholten>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Boni_K._Boksteen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jurriaan_Schmitz>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_G._Steeneken>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Raymond_J._E._Hueting>
swrc:pages 321-324 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/ESSDERC.2014.6948825>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/essderc>
dc:title Identifying failure mechanisms in LDMOS transistors by analytical stability analysis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document