Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/essderc/HanJDZLKCE22
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Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology.
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Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology.
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